Electronic properties of epitaxial cerium oxide films during controlled reduction and oxidation studied by resonant inelastic x-ray scattering

G. Gasperi, L. Amidani, F. Benedetti, F. Boscherini, P. Glatzel, S. Valeri, P. Luches, Phys. Chem. Chem. Phys. 18, 20511 (2016).